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INTERNATIONAL PATENT: FUJI ELECTRIC CO., LTD., 富士電機株式会社 FILES APPLICATION FOR "SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE"

GENEVA, March 3 -- FUJI ELECTRIC CO., LTD. (1-1, Tanabeshinden, Kawasaki-ku, Kawasaki-shi, Kanagawa2109530), 富士電機株式会社 (神奈川&... Read More


INTERNATIONAL PATENT: SOKEN, INC., 株式会社SOKEN, DENSO CORPORATION, 株式会社デンソー FILES APPLICATION FOR "POSITION IDENTIFICATION SYSTEM, POSITION IDENTIFICATION DEVICE AND POSITION IDENTIFICATION METHOD"

GENEVA, March 3 -- SOKEN, INC. (500-20, Minamiyama, Komenoki-cho, Nisshin-city Aichi4700111), 株式会社SOKEN (愛知県日... Read More


INTERNATIONAL PATENT: CANON KABUSHIKI KAISHA, キヤノン株式会社 FILES APPLICATION FOR "IMAGE PROCESSING METHOD, IMAGE PROCESSING DEVICE, IMAGE PROCESSING SYSTEM AND PROGRAM"

GENEVA, March 3 -- CANON KABUSHIKI KAISHA (30-2, Shimomaruko 3-chome, Ohta-ku, Tokyo1468501), キヤノン株式会社 (東京都大田... Read More


INTERNATIONAL PATENT: KYOCERA CORPORATION, 京セラ株式会社 FILES APPLICATION FOR "CUTTING INSERT, CUTTING TOOL AND METHOD FOR MANUFACTURING CUT PRODUCT"

GENEVA, March 3 -- KYOCERA CORPORATION (6, Takeda Tobadono-cho, Fushimi-ku, Kyoto-shi, Kyoto6128501), 京セラ株式会社 (京都府京都... Read More


INTERNATIONAL PATENT: JSR CORPORATION, JSR株式会社 FILES APPLICATION FOR "RADIATION-SENSITIVE COMPOSITION, RESIST PATTERN FORMATION METHOD AND COMPOUND"

GENEVA, March 3 -- JSR CORPORATION (9-2, Higashi-Shinbashi 1-chome, Minato-ku, Tokyo1058640), JSR株式会社 (東京都港区東... Read More


INTERNATIONAL PATENT: HITACHI, LTD., 株式会社日立製作所 FILES APPLICATION FOR "ANONYMOUS SEARCH SYSTEM, METHOD AND NON-TEMPORARY STORAGE MEDIUM"

GENEVA, March 3 -- HITACHI, LTD. (6-6, Marunouchi 1-chome, Chiyoda-ku, Tokyo1008280), 株式会社日立製作所 (東京都千代... Read More


INTERNATIONAL PATENT: DAIKIN INDUSTRIES, LTD., ダイキン工業株式会社 FILES APPLICATION FOR "SIGNAL PROCESSING METHOD, INFORMATION PROCESSING DEVICE, OPTICAL COHERENCE TOMOGRAPHY DEVICE AND PROGRAM"

GENEVA, March 3 -- DAIKIN INDUSTRIES, LTD. (Osaka Umeda Twin Towers South, 1-13-1, Umeda, Kita-ku, Osaka-Shi, Osaka5300001), ダイキン工業株式会&#3... Read More


INTERNATIONAL PATENT: HAMAMATSU PHOTONICS K.K., 浜松ホトニクス株式会社 FILES APPLICATION FOR "LIGHT DETECTION DEVICE"

GENEVA, March 3 -- HAMAMATSU PHOTONICS K.K. (1126-1, Ichino-cho, Chuo-ku, Hamamatsu-shi, Shizuoka4358558), 浜松ホトニクス株式会社 (&#3... Read More


INTERNATIONAL PATENT: NSK LTD., 日本精工株式会社 FILES APPLICATION FOR "METHOD FOR DETECTING DEFECTS IN ROLLING BEARING AND METHOD FOR DETECTING DETERIORATION STATE OF ROLLING BEARING"

GENEVA, March 3 -- NSK LTD. (6-3, Ohsaki 1-chome, Shinagawa-ku, Tokyo1418560), 日本精工株式会社 (東京都品川区&#22823... Read More


INTERNATIONAL PATENT: HITACHI HIGH-TECH CORPORATION, 株式会社日立ハイテク FILES APPLICATION FOR "AUTOMATED ANALYZER"

GENEVA, March 3 -- HITACHI HIGH-TECH CORPORATION (17-1, Toranomon 1-chome, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京&... Read More